hts_entries: 26188

Tariff line items with duty rates, units, and classification hierarchy. Search uses full-text search on the description column. To look up a specific HTS code, use the column filter rather than the search box.

Data license: Public Domain · Data source: US International Trade Commission

This data as json

id	hts_code	indent	description	unit	general_rate	special_rate	column2_rate	footnotes	chapter_id
26188	9031.49.70.00	3	For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices	No.	Free		50%	[{"columns": ["general"], "marker": "1", "value": "See 9903.88.01.", "type": "endnote"}]	49